Applying Multivariate Statistical Analysis to Atom Probe Tomography
نویسنده
چکیده
Atom probe tomography (APT) is a powerful method for studying the microstructure and chemistry of materials at the unit-cell level [1]. Because APT produces datasets containing up to billions of atom identities, new methods of analysis are being developed to rapidly datamine information from the APT data. Spectrum imaging (SI) methods utilizing multivariate statistical analysis (MVSA) are becoming standard for acquiring and interpreting analytical electron microscopy (AEM) data [2-4]. Here, the hypothesis that SI techniques can elucidate APT data is explored.
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